CIS-LIBSレーザー元素分析システム

CIS-LIBS Laser Element Analysis System Applications and Related Testing Solutions

CIS-LIBS Laser Element Analysis System supports industrial testing and quality inspection applications that require stable operation, clear measurement results, and dependable process control.

Related Products: Olympus CIX100 Cleanliness Analysis System | CIS30-S Intelligent Cleanliness Analysis System | CIS-AE Series Fully Automatic Cleanliness Extraction System

The CIS-LIBS Laser Element Analysis System is a cutting-edge solution for rapid, non-destructive particle composition detection, designed to replace complex traditional workflows. Integrating advanced LIBS technology with intelligent automation, it enables users to identify elemental composition (e.g., Cu, Al, Fe) of particles in just 3 seconds—directly in air, without preprocessing.

Core Components & Technology

The system combines high-precision hardware for seamless analysis:

• Nanosecond UV Laser: Features narrow pulse width, high peak power, and long lifespan, enabling precise ablation of particle surfaces with minimal damage. Paired with a UV laser objective (high NA, high transmittance, small spot size), it ensures focused energy delivery.

  
  

• Spectrometer: Multi-channel design with wide wavelength coverage, high resolution, and sensitivity, capturing ionized light from ablated particles.

  
  

• High-Speed Camera: Equipped with a 2.3MP sensor (1920×1080 resolution), 480fps frame rate, and large field of view, it aids in locating regions of interest (ROIs) for analysis.

  
  

• Motorized Stage: Large-travel (high resolution, speed) platform supports scanning of large parts, with software control + joystickfine adjustment for precise positioning.

  
  

• Olympus BX53M Optical Path: Ensures high optical quality with bright-field metallographic imaging, compatible with COMSOL Multiphysics and CAD software for data integration.

  
  

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Working Principle: Air-Based One-Click Analysis

The system simplifies element detection into 5 automated steps (as shown in Figure 1):

1. UV Laser Ablation: A focused nanosecond UV laser bombards the particle surface, ionizing surface elements.

   
   

2. Plasma Emission: Ionized elements recombine, emitting characteristic light spectra.

   
   

3. Spectrometer Capture: The spectrometer collects and splits light into wavelength bands to identify elemental signatures.

   
   

4. Database Matching: An internal database automatically matches spectra to elements (e.g., Cu, Al, Fe) and quantifies concentrations.

   
   

5. Report Generation: A full-particle material report is generated, detailing elemental composition and distribution.

   
   

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Advantages Over Traditional Element Analysis

Compared to conventional workflows (Figure 2), CIS-LIBS eliminates critical pain points:

• No Preprocessing: Analyzes particles directly in air—no cutting, grinding, vacuum chambers, or conductivity treatments. Targets of any size/shape are acceptable.

  
  

• Single-Device Efficiency: Replaces multi-equipment setups (microscopes + preprocessors + analyzers) with one compact unit, reducing costs and space.

  
  

• Rapid Results: Delivers element discrimination in 3 seconds via one-click operation, slashing analysis time from hours to seconds.

  
  

• Low Skill Requirement: Operators with basic training can perform analysis—no specialized expertise needed, unlike traditional high-complexity devices.

  
  

Technical Specifications

• Detection Principle: Laser-Induced Breakdown Spectroscopy (LIBS)

  
  

• Laser: Nanosecond UV laser (narrow pulse width, high peak power)

  
  

• Spectrometer: Multi-channel, wide wavelength range, high SNR

  
  

• Camera: 2.3MP (1920×1080), 480fps, RGB sensor

  
  

• Stage: Motorized (software + joystick control), large travel range, high resolution

  
  

• Software: Auto-reporting, Q-DTS data integration, compliance with ISO/VDA standards

  
  

• Environment: Operating temp 0–45°C, humidity 0–85% (non-condensing)

  
  

• Physical: ~50kg, compact dimensions, 12-month warranty

  
  

Applications

Ideal for industries requiring particle contamination control: automotive (brake/fuel systems), semiconductors (wafer defects), precision manufacturing (additive parts), and aerospace (hydraulic components).

The CIS-LIBS system redefines element analysis with speed, simplicity, and precision—making it the go-to solution for modern quality control.

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